Skip to main content
31 March - 2 April 2025 |
Lyon, France
User account menu
Log in
Design, Automation and Test in Europe Conference |
The European Event for Electronic System Design & Test
Authors' Guidelines
Authors' Guidelines for Camera-Ready Submission of Accepted Papers
Authors' Guidelines for Audio-Visual Presentation
Guidelines for Tutorial and Workshop Organisers
Programme
Tutorials
Workshops
Detailed Programme
Keynotes
ASD Initiative
Young People Programme
Registration
Venue
Accommodation & Travel
Conference Venue
Promotion & Sponsorship
Sponsors and Promotion Partners
Call for Papers
Committees
DEC - DATE Executive Committee
TPC - DATE Technical Programme Committee
TPC Rules
DATE Fellows
DSC - DATE Sponsors Committee
Archive
Breadcrumb
Home
Wei Pan, ON Semiconductor, United States
Design, Automation and Test in Europe Conference |