The DATE 2017 Conference and Exhibition closed doors last Friday, March 31, 2017, receiving more than 1,500 registrations from over 50 countries and ending with excellent feedback from both participants and exhibitors.
2017 was a special year for the world’s favourite electronic systems design and test conference, as the community celebrated its 20th edition and it was held for the first time in Switzerland, at the SwissTech Convention Center on the EPFL campus in Lausanne, from March 27 to 31, 2017.
DATE 2017 received 794 paper submissions, a large share (42%) coming from authors in Europe, 32% from America, 25% from Asia, and 1% from the rest of the world. This clearly demonstrates DATE’s international character, its global reach and impact.
For the 20th successive year, DATE presented an exciting technical programme, comprising 78 technical sessions and 11 Exhibition Theatre sessions. The DATE week started on Monday with nine in-depth tutorials and the popular PhD Forum, hosted by EDAA, ACM SIGDA, and IEEE CEDA.
On Tuesday, the conference was opened by the plenary keynote speakers Dr. Arvind Krishna from IBM presenting “Design Automation in the Era of AI and IoT: Challenges and Pitfalls” and Dr. Doug Burger from Microsoft who talked about “A New Era of Hardware Microservices in the Cloud”. In addition, a keynote lecture from Prof. Giovanni De Micheli (Professor at EPFL and Director of Nano-Tera.ch) was given on "Distributed Systems for Health and Environmental Monitoring" within the Nano-Tera.ch initiative. On the same day, an Executive Panel Session and three Innovative Technologies & Applications (IT&A) Sessions offered a series of business panels discussing hot topics. Executive speakers from companies leading the design and automation industry will address some of the complexity issues in electronics design and discuss about the advanced technology challenges and opportunities. A special session was dedicated to Ralph Otten, pioneer of physical design, who prematurely died in an accident.