ET4.8.1 Implementing an Automotive In-System Test Solution

Start
17:00
End
17:30

Ensuring vehicle electronics reliability levels as mandated by the ISO 26262 standard requires periodic testing during functional operation. The Tessent MissionMode architecture provides system-level access to all on-chip test resources for key-on, key-off and runtime testing. This presentation will walk through the flow for implementing a chip-level architecture incorporating the MissionMode solution integrated with both logic BIST and Memory BIST capabilities.