Technical Programme Committee 2017

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Topic: T4 System-Level Reliability Design, Analysis and On-line Test

Fault models: Permanent, Transient and Soft Errors; Dependability Evaluation; Space-, Time- and Information-redundancy based dependability solutions; Highly-Available Systems; Reliable, Secure and Fail-Safe System Design; HW/SW solutions for on-line fault detection, tolerance, recovery and aging mitigation; Countermeasures Against Fault Attacks.

Chair: Cristiana Bolchini, Politecnico di Milano, IT, Contact Cristiana Bolchini

Co-Chair: Jaume Abella, Barcelona Supercomputing Center, ES, Contact Jaume Abella

Members: