Technical Programme Committee 2017

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Topic: T2 Test Generation, Simulation and Diagnosis

Algorithms for test pattern generation (TPG); TPG for delay and small-delay faults; TPG for low power; Algorithms for test compression and compaction; ATPGs; Fault simulation; Diagnosis; Power Issues in Testing; Test generation for: Microprocessors, Memories, FPGAs and regular structures; Algorithms for board and system test; Volume diagnosis and yield analysis

Chair: Wu-Tung Cheng, Mentor Graphics, US, Contact Wu-Tung Cheng

Co-Chair: M. Sonza Reorda, Politecnico di Torino, IT, Contact M. Sonza Reorda