Technical Programme Committee 2017

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Topic: DT5 Design and Test for Analog and Mixed-Signal Circuits and Systems, and MEMS

Layout and topology generation; architecture, system and circuit synthesis and optimization; formal and symbolic techniques; hardware description languages and models of computation; innovative circuit topologies and architectures; MEMS; self-healing and self-calibration; test generation; fault modeling and simulation; built-in self-test; design-for-test; fault diagnosis; defect characterization and failure analysis; on-line test and fault tolerance; design-for-manufacturability and design-for-yield; test metrics and economics.

Chair: André Ivanov, , CA, Contact André Ivanov

Co-Chair: Georges Gielen, European Design and Automation Association (EDAA) vzw, BE, Contact Georges Gielen