Topic: T3 Design-for-Test, Test Compression and Access

Design for test, debug, diagnosis, manufacturing and yield; hardware infrastructure for test, self-test, debug, diagnosis and post-silicon validation; reconfigurable scan; test of memories and regular structures; DFT for 3D-systems; test compression and compaction; power aspects of DFT; security and safety implications of test infrastructure; automatic test equipment; test economics and test standards.

Chair: Sybille Hellebrand, University of Paderborn, DE, Contact

Co-Chair: Magdy Abadir, Independent, US, Contact

Members:

• Dimitris Gizopoulos, University of Athens, Gr, Contact
• Peter Harrod, ARM Ltd, GB, Contact
• Paolo Prinetto, Politecnico di Torino, IT, Contact
• Ozgur Sinanoglu, NYU-AD University, AE, Contact
• Hans-Joachim Wunderlich, University of Stuttgart, DE, Contact