Topic: T2 Test Generation, Simulation and Diagnosis

Test pattern generation (TPG); fault simulation; system test; test coverage metrics and estimation; adaptive test; self-healing/self-calibration/self-adaptation; diagnosis; debug; post-silicon validation; testing at various levels of a system: embedded core, System-on-Chip, System-in-Package, 3D chips; hardware/software system test; processor based test.

Chair: Bernd Becker, University of Freiburg, DE, Contact

Co-Chair: Wu-Tung Cheng, Mentor Graphics, US, Contact

Members:

• Jacob Abraham, University of Texas at Austin, US, Contact
• Piet Engelke, Infineon, DE, Contact
• Huawei Li, Institute of Computing Technology, CAS, CN, Contact
• Nicola Nicolici, McMaster University, CA, Contact
• matteo sonza reorda, politecnico di torino - DAUIN, IT, Contact
• Xiaoqing Wen, Kyushu Institute of Technology, JP, Contact