Topic: T5 On-Line Test, Fault Tolerance and Reliable System Design

Transient fault evaluation; soft error susceptibility; on-line testing and fault tolerance for signal integrity; concurrent monitors and diagnosis; coding techniques; in-field testing and diagnosis; on-line testing; high availability systems; secure and safe circuits and systems design; dependability evaluation, reliable system design; redundant systems design; hardware/software recovery; self-repair; fault tolerance; on-line testing and fault tolerance for industrial applications.

Chair: Lorena Anghel, TIMA, FR, Contact

Co-Chair: Fabrizio Lombardi, Northeastern University, US, Contact

Members:

• Jaume Abella, Barcelona Supercomputing Center, ES, Contact
• Dan Alexandrescu, iRoC Technologies, FR, Contact
• Cristiana Bolchini, Politecnico di Milano, IT, Contact
• Jie Han, Member IEEE, CA, Contact
• Yiorgos Makris, Dallas University, US, Contact
• Diana Marculescu, CMU, US, Contact
• Michael Nicolaidis, TIMA, FR, Contact
• Antonis Paschalis, University of Athens, GR, Contact
• salvatore Pontarelli, University of Rome "Tor Vergata", IT, Contact
• Pedro Reviriego, Universidad Antonio de Nebrija, ES, Contact
• Andreas Steininger, Vienna University of Technology, AT, Contact
• Xavier Vera, Intel, ES, Contact