Test generation; test instrumentation; built-in test; built-in self-test; design-for test; defect characterization; failure analysis; fault modeling; fault simulation; defect-oriented test; test coverage metrics and estimation; adaptive test; self-healing/self-calibration/self-adaptation; design-for-manufacturability and design-for-yield; diagnosis and self-repair; test economics.
Chair: haralampos [dot] stratigopoulos lip6 [dot] fr, Contact
Co-Chair: Andre Ivanov, UBC, CA, Contact
Members: