W6 MEDIAN - Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale
Agenda
Agenda
| Time | Label | Session |
|---|---|---|
| 08:30 | W6.1 | Opening Session Organisers: Chair: Co-Chair: Welcoming comments |
| 08:45 | W6.2 | Keynote Talk |
| 08:45 | W6.2.1 | Designing Efficient and Reliable Multicore Processors for Networking, Servers, and Beyond Shubu Mukherjee, Cavium Networks, US |
| 09:45 | W6.3 | Paper Session I: New Challenges at the System Level |
| 09:45 | W6.3.1 | Multi-Core Emulation for Dependable and Adaptive Systems Prototyping Cristiana Bolchini and Matteo Carminati, Politecnico di Milano, IT |
| 09:45 | W6.3.2 | Fault-tolerant Routing Approach for 3D Stacked Meshes Masoumeh Ebrahimi, Masoud Daneshtalab and Juha Plosila, University of Turku, FI |
| 10:30 | W6 | Coffee Break |
| 11:00 | W6.4 | Paper Session II: Reliability Threads in New Technologies |
| 11:00 | W6.4.1 | Invited Talk - Steep Slope Devices: Opportunities and Challenges for Processor Design Vijaykrishnan Narayanan, Penn State, US |
| 11:00 | W6.4.2 | BTI reliability from Planar to FinFET nodes: Will the next node be more or less reliable? Halil Kukner1, Pieter Weckx2, Praveen Raghavan1, Ben Kaczer1, Doyoung Jang1, Francky Catthoor3, Liesbet Van der Perre2, Rudy Lauwereins3 and Guido Groeseneken3 1IMEC, BE; 2KU Leuven, BE; 3IMEC, KU Leuven, BE |
| 11:00 | W6.4.3 | Analysis of Random Dopant Fluctuations and Oxide Thickness on a 16nm L1 Cache Design*) Cagri Eryilmaz1, Azam Seyedi2, Ozman Unsal3 and Andrian Cristal4 1Middle Eastern Technical University, TR and Barcelona Supercomputing Center, ES, ; 2Barcelona Supercomputing Center and Universitat Politecnica de Catalunya, ES; 3Barcelona Supercomputing Center, ES; 4Barcelona Supercomputing Center, Universitat Politecnica de Catalunya and IIIA-CSIC, ES |
| 12:00 | W6 | Lunch Break |
| 13:00 | W6.5 | Paper Session III: Application Specific Solutions |
| 13:00 | W6.5.1 | FPGA Defect Tolerance based on Equivalent Configurations Generation Parthasarathy M. B. Rao, Abdulazim Amouri and Mehdi B. Tahoori, Karlsruhe Institute of Technology, DE |
| 13:00 | W6.5.2 | A Complex Control System for Testing Fault-Tolerance Methodologies*) Jakub Podivinsky, Marcela Simkova and Zdenek Kotasek, Brno University of Technology, CZ |
| 13:30 | W6.6 | Panel Session Organiser: Chair: |
| Panelists: Speakers: Mehdi Tahoori1, Oliver Bringmann2, Adrian Evans3 and Viacheslav Izosimov4 1Karlsruhe Institute of Technology, DE; 2FZI/University of Tuebingen, DE; 3iROC, FR; 4Semcon, SE | ||
| 14:30 | W6.7 | Coffee Break & Poster Session |
| 14:30 | W6.7.1 | BADR: Boosting Reliability Through Dynamic Redundancy Ihsen Alouani1, Smail Niar1, Mazen Saghir2 and Fadi Kurdahi3 1University of Valenciennes, FR; 2Texas A&M University, QA; 3University of California at Irving, US |
| 14:30 | W6.7.2 | Automatic Detection and Correction of Defective Pixels for Medical and Space Imagers Eliahu Cohen1, Moriel Shnitser2, Tsvika Avraham2, Ofer Hadar2 and Yocheved Dotan3 1Tel-Aviv University, IL; 2Ben-Gurion University, IL; 3Ruppin Academic Center, IL |
| 14:30 | W6.7.3 | Implementing Double Error Correction Orthogonal Latin Squares Codes in Xilinx FPGAs Mustafa Demirci1, Pedro Reviriego2 and Juan Antonio Maestro2 1Alesan, TR; 2Universidad Antonio de Nebrija, ES |
| 14:30 | W6.7.4 | On Reliability Enhancement Using Adaptive Core Voltage Scaling and Variations on TSMC 28nm LP process process FPGAs Petr Pfeifer and Zdenek Pliva, Technical University of Liberec, CZ |
| 14:30 | W6.7.5 | Power and Performance Optimization in Long-term Operation André Romão1, Jorge Semião1, Carlos Leong2, Marcelino Santos3, Isabel Teixeira3 and Paulo Teixeira3 1University of Algarve, PT; 2INESC-ID, PT; 3Technical University of Lisbon, PT |
| 15:00 | W6.8 | Paper Session IV: Resiliency, Self-Test and Self-Diagnosis |
| 15:00 | W6.8.1 | Invited Talk - DEEP-ER: Scalable resiliency in Exascale Computing Michael Kauschke, Intel, DE |
| 15:00 | W6.8.2 | Improving the Reliability of Skewed Caches through ECC based Hashes Sercan Yegin1, Burak Karsli1, Oguz Ergin1, Marco Ottavi2, Salvatore Pontarelli2 and Pedro Reviriego3 1TOBB University, TR; 2University of Rome Tor Vergata, IT; 3Universidad Antonio de Nebrija, ES |
| 15:00 | W6.8.3 | A new Diagnostic method for VLIW Processors*) Davide Sabena, Luca Sterpone and Matteo Sonza Reorda, Politecnico di Torino, IT |
| 15:00 | W6.8.4 | Aging Monitoring Methodology for Built-In Self-Test Applications*) João Coelho1, Jorge Semião1, Carlos Leong2, Marcelino Santos3, Isabel Teixeira3 and Paulo Teixeira3 1University of Algarve, PT; 2INESC-ID, PT; 3Technical University of Lisbon, PT |
| 16:15 | W6.9 | Closing Session |
*)indicates short paper
Groups:
