Identification, characterization and modeling of defects, faults and degradation mechanisms; reliability analysis and modeling techniques, FMEA and physics of failure; test for noise and uncertainty; design for reliability and design for variability and their impact on test; Test and reliability issues in the presence of leakage. Challenges of ultra low-power design on test and reliability; Modeling and test techniques for physical sources of errors such as process, voltage and temperature variations; error-resilient nano design systems.