4.1 Executive Session 3: The Future of Test

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Date: Tuesday, March 26, 2019
Time: 17:00 - 18:30
Location / Room: Room 1

Chair:
Subhasish Mitra, Stanford University, US, Contact Subhasish Mitra

This session titled "The Future of Test" explores various aspects of test: from traditional manufacturing test, to its role in addressing yield and reliability at advanced technology nodes, all the way to the design and test of quantum computers. The role of testing beyond manufacturing (e.g., in system validation and security) will also be explored.

TimeLabelPresentation Title
Authors
17:004.1.1YIELD AND RELIABILITY CHALLENGES AND SOLUTIONS AT 7NM AND BELOW
Speaker and Author:
Andrzej Strojwas, Carnegie Mellon University and PDF Solutions, US
17:304.1.2THREE POSSIBLE ALTERNATE REALITIES FOR THE FUTURE OF TEST
Speaker and Author:
Jeff Rearick, AMD, US
18:004.1.3WHAT ABOUT THE DESIGN AND TEST OF QUANTUM COMPUTERS?
Speaker and Author:
Leon Stok, IBM, US
18:30End of session
Exhibition Reception in Exhibition Area

The Exhibition Reception will take place on Tuesday in the exhibition area, where free drinks for all conference delegates and exhibition visitors will be offered. All exhibitors are welcome to also provide drinks and snacks for the attendees.