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Model Order Reduction for Nanoelectronics Coupled Problems with Many Inputs
N. Banagaaya1,a, L. Feng1,b, W. Schoenmaker2,d, P. Meuris2,e, A. Wieers3,f, R. Gillon3,g and P. Benner1,c
1Max Planck Institute for Dynamics of Complex Technical Systems, Magdeburg, Germany.
abanagaaya@mpi-magdeburg.mpg.de
bfeng@mpi-magdeburg.mpg.de
cbenner@mpi-magdeburg.mpg.de
2Magwel NV, Martelarenplein 13, B-3000 Leuven, Belgium.
dwim.schoenmaker@magwel.com
epeter.meuris@magwel.com
3ON Semiconductor Belgium, Oudenaarde, Belgium.
fAarnout.Wieers@onsemi.com
gRenaud.Gillon@onsemi.com
ABSTRACT
This paper is concerned with Model Order Reduction (MOR) for nanoelectronics coupled problems with many inputs. Our main applications are electro-thermal coupled problems described by nonlinear quadratic differential-algebraic systems (DAEs). We present algorithms that combine the advantages of the splitting techniques for DAEs and the existing MOR methods for systems with many inputs such as sparse implicit projection (SIP) for RC/RLC networks and MOR based on the superposition principle.
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