Technical Programme Committee 2012

Topic: T5 On-Line Testing and Fault Tolerance

addressing design-oriented embedded test solutions as well as defect analysis, modeling, test generation and silicon debugging. Emphasis is on both system- and chip-level test.

Chair: Cecilia Metra, University of Bologna, IT, Contact Cecilia Metra, phone: +390512093038

Co-Chair: Lorena Anghel, TIMA, FR, Contact Lorena Anghel

Members:

• Jaume Abella, Barcelona Supercomputing Center, ES, Contact Jaume Abella
• Cristiana Bolchini, Politecnico di Milano, IT, Contact Cristiana Bolchini
• Dimitris Gizopoulos, University of Athens, Department of Informatics & Telecommunications, GR, Contact Dimitris Gizopoulos
• Fabrizio Lombardi, Northeastern University, US, lombardi ece [dot] neu [dot] edu
• Diana Marculescu, CMU, US, dianam ece [dot] cmu [dot] edu
• Michael Nicolaidis, TIMA, FR, michael [dot] nicolaidis imag [dot] fr
• Ilia Polian, University of Passau, DE, ilia [dot] polian uni-passau [dot] de
• Xavier Vera, Intel, ES, Contact Xavier Vera