9.5 Advances in Test Pattern Generation
Date:
Thu, 2009-04-23Time:
08:30 - 10:00Location / Room:
Erato, Level 3Moderators:
H Obermeir, Infineon, DE
N Nicolici, McMaster U, CA
For modern designs the generation of test sets under different constraints is of importance. The first paper in this session deals with the generation of small test sets. Then compact tests with high defect coverage are targeted. Finally an approach taking power considerations into account is presented.
| 0830 | GENERATION OF COMPACT TEST SETS WITH HIGH DEFECT COVERAGE X Kavousianos, Ioannina U, GR K Chakrabarty, Duke U, US |
| 0900 | A SCALABLE METHOD FOR THE GENERATION OF SMALL TEST SETS S Remersaro and S M Reddy. Iowa U, US J Rajski, Mentor Graphics Corporation, US I Pomeranz, Purdue U, US |
| 0930 | QC-FILL: AN X-FILL METHOD FOR QUICK-AND-COOL SCAN TEST C-W Tzeng and S-Y Huang, National Tsing-Hua U, Taiwan, ROC |
