3.2 Variability and Reliability Aware Energy Management
Date:
Tue, 2009-04-21Time:
14:30 - 16:00Location / Room:
Clio, Level 3Moderators:
M Miranda, IMEC, BE
W Dehaene, KU Leuven, BE
This session addresses various aspects of energy management in nanometer technologies. From novel variability aware circuit design in sub-threshold region to robust design under ageing, manufacturing variations and noise impact.
| 1430 | VARIATION RESILIENT ADAPTIVE CONTROLLER FOR SUBTHRESHOLD CIRCUITS B Mishra, B M Al-Hashimi and M Zwolinski, Southampton U, UK |
| 1500 | MINIMIZATION OF NBTI PERFORMANCE DEGRADATION USING INTERNAL NODE CONTROL D R Bild, G E Bok and R P Dick - Northwestern U, US |
| 1530 (S) | PHYSICALLY CLUSTERED FORWARD BODY BIASING FOR VARIABILITY COMPENSATION IN NANO-METER CMOS DESIGN A Sathanur, EPFL, Lausanne, CH and Politecnico di Torino, IT A Pullini and G De Micheli, EPFL, Lausanne, CH L Benini, Bologna U, IT E Macii, Politecnico di Torino, IT |
| 1545 (S) | AN EVENT-GUIDED APPROACH TO HANDLING INDUCTIVE NOISE IN PROCESSORS M S Gupta, V J Reddi, M D Smith, G-Y Wei and D Brooks, Harvard U, US |
