12.5 Mixed-Signal/RF Testing and DFX Engineering
Date:
Thu, 2009-04-23Time:
16:00 - 17:30Location / Room:
Erato, Level 3Moderators:
J Machado da Silva, INESC, PT
C Wegener, Infineon Technologies, DE
This session addresses issues on testing, parameter identification and reliability simulation of mixed-signal and RF devices, such as data converters, low-noise amplifiers and voltage controlled oscillators.
| 1600 | A LOOPBACK-BASED INL TEST METHOD FOR D/A AND A/D CONVERTERS EMPLOYING A STIMULUS IDENTIFICATION TECHNIQUE E Korhonen and J Kostamovaara, Oulu U, FI |
| 1630 | A NOVEL SELF-HEALING METHODOLOGY FOR RF CIRCUITS BASED ON OSCILLATION PRINCIPLES A Goyal, M Swaminathan and A Chatterjee, Georgia Tech, US |
| 1700 | AN APPROACH TO LINEAR MODEL-BASED TESTING AND DIAGNOSIS FOR NONLINEAR CASCADED MIXED-SIGNAL SYSTEMS R Mueller and H-J Jentschel, TU Dresden, DE C Wegener, S Sattler and H Mattes, Infineon Technologies, DE |
| 1715 (S) | ENRICHMENT OF LIMITED TRAINING SETS IN MACHINE-LEARNING-BASED ANALOG/RF TEST H-G Stratigopoulos and S Mir, TIMA Laboratory, FR Y Makris, Yale U, US |
