11.5 Test Data Compression
Date:
Thu, 2009-04-23Time:
14:00 - 15:30Location / Room:
Erato, Level 3 Moderators:
J Vial, Infineon, FR
T Yoneda, Nara Institute of Science and Technology, JP
This session includes four papers on advances in test-data compression. The first paper describes a test-access mechanism for adaptive scan technology. The second paper presents a built-in mechanism for controlling seed reloads during LFSR reseeding. The third paper addresses seed selection for the detection of small-delay defects. The final paper presents a coding technique for reducing test-data volume and capture power.
| 1400 | SCALABLE ADAPTIVE SCAN A Chandra, R Kapur and Y Kanzawa, Synopsys, US |
| 1430 | LFSR-BASED TEST-DATA COMPRESSION WITH SELF-STOPPABLE SEEDS M Koutsoupia and D Nikolos, Patras U, GR E Kalligeros, U of the Aegean, GR X Kavousianos, Ioannina U, GR |
| 1500 (S) | SEED SELECTION IN LFSR-RESEEDING-BASED TEST COMPRESSION FOR THE DETECTION OF SMALL-DELAY DEFECTS M Yilmaz and K Chakrabarty, Duke U, US |
| 1515 (S) | A GENERIC FRAMEWORK FOR SCAN CAPTURE POWER REDUCTION IN FIXED-LENGTH SYMBOL-BASED TEST COMPRESSION ENVIRONMENT X Liu and Q Xu, The Chinese U of Hong Kong, PRC |
