IP4 Interactive Presentations
Date:
Thu, 2009-04-23Time:
10:00 - 10:30Location / Room:
Exhibition Hall Rhodes, Level 2Each Interactive presentation will run on a ten minute rotation (three presentations per session) and will additionally be supported by a poster which will be on display throughout the morning.
| 1. | SEMIFORMAL VERIFICATION OF TEMPORAL PROPERTIES IN AUTOMOTIVE HARDWARE DEPENDENT SOFTWARE D Lettnin, P K Nalla, J Behrend, J Ruf, J Gerlach, T Kropf and W Rosenstiel, Tuebingen U, DE V Schoenknecht and S Reitemeyer, NEC Electronics (Europe) GmbH, DE |
| 2. | ON THE RELATIONSHIP BETWEEN STUCK-AT FAULT COVERAGE AND DELAY FAULT COVERAGE J Schat, NXP Semiconductors, NL |
| 3. | SYSTEM-LEVEL HARDWARE-BASED PROTECTION OF MEMORY AGAINST SOFT-ERRORS V Gherman, S Evain, M Cartron, N Seymour and Y Bonhomme, CEA, LIST, FR |
| 4. | A STUDY OF THE SINGLE EVENT EFFECTS IMPACT ON FUNCTIONAL MAPPING WITHIN FLASH-BASED FPGAS F Abate, L Sterpone and F Abate, Politecnico di Torino, IT F G De Lima Kastensmidt, UFRGS, BR |
| 5. | A METHOD TO ANALYZE QUANTIZATION ERRORS IN WIRELESS APPLICATIONS D Novo, M Li, B Bougard, L Van Der Perre and F Catthoor, IMEC, BE |
| 6. | A PHYSICAL-LOCATION-AWARE X-FILLING METHOD FOR IR-DROP REDUCTION IN AT-SPEED SCAN TEST W-W Hsieh, I-S Lin and T T Hwang, National Tsing Hua U, Taiwan, ROC |
| 7. | EFFICIENT RELIABILITY SIMULATION OF ANALOG ICS INCLUDING VARIABILITY AND TIME-VARYING STRESS E Maricau and G Gielen, KU Leuven, BE |
| 8. |
A GENERIC ARCHITECTURE OF CCSDS LOW DENSITY PARITY CHECK DECODER FOR NEAR-EARTH APPLICATIONS F Charot and C Wolinski, IRISA, Inria, FR |
| 9. | PROPERTY ANALYSIS AND DESIGN UNDERSTANDING IN A QUALITY-DRIVEN BOUNDED MODEL CHECKING FLOW U Kuehne, D Grosse and R Drechsler, Bremen U, DE |
| 10. | TEST EXPLORATION AND VALIDATION USING TRANSACTION LEVEL MODELS M A Kochte, C G Zoellin, M E Imhof, R Salimi Khaligh, M Radetzki and H-J Wunderlich, Stuttgart U, DE S Di Carlo and P Prinetto, Politecnico di Torino, IT |
