W6 MEDIAN - Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale

Printer-friendly versionSend by emailPDF version
Date: 
Fri, 2014-03-28
Time: 
08:30-16:30
Location / Room: 
Konferenz 6

General Chairs:
Mehdi Tahoori, Karlsruhe Institute of Technology, DE
Oliver Brignmann, FZI/University of Tuebingen, DE

Program Chairs:
Maria K. Michael, University of Cyprus, CY
Ozcan Ozturk, Bilkent University, TR

Panel Session Chair:
Said Hamidioui, Delft University of Technology, NL

Submissions Chair:
Michael Skitsas, University of Cyprus, CY

Program Committees:
Chris Bleakley, UC Dublin, IE
Adrian Cristal, BSC, ES
Shidhartha Das, ARM, GB
Oguz Ergin, TOBB University, TR
Adrian Evans, IROC, FR
Dimitris Gizopoulos, University of Athens, GR
Said Hamdioui, TUDelft, NL
Viacheslav Izosimov, Semcon, SE
Ben Kaczer, IMEC, BE
Ismail Kadayif, COMU, TR
Israel Koren, University of Massachusetts Amherst, US
Zdenek Kotasek, Brno University of Technology, CZ
Hans Manhaeve, Ridgetop, BE
Maria Michael, University of Cyprus, CY
Antonio Miele, Politecnico di Milano, IT
Amir Nahir, IBM, IL
Smail Niar, Universit of Valenciennes, FR
Chrysostomos Nicopoulos, University of Cyprus, CY
Marco Ottavi, University of Rome Tor Vergata, IT
Ozcan Ozturk, Bilkent University, TR
Salvatore Pontarelli, University of Rome Tor Vergata, IT
Pedro Reviriego, University of Nebrija, ES
Guillaume Prenat, Spintec, FR
Ioannis Sourdis, Chalmers University, SE
Vilas Sridharan, AMD, GB
Suleyman Tosun, Ankara University, TR
Osman Unsal, BSC, ES

Description

Workshop scope

Constant advances in manufacturing yield and field reliability are important enabling factors for electronic devices pervading our lives, from medical to consumer electronics, from railways to the automotive and avionics scenarios. At the same time, both technology and architectures are today at a turning point; many ideas are being proposed to postpone the end of Moore’s law such as extending CMOS technology as well as finding alternatives to it like CNTFET, QCA, memristors, etc., while at the architectural level, the spin towards higher frequencies and aggressive dynamic instruction scheduling has been replaced by the trend of including many simpler cores on a single die. These paradigm shifts imply new dependability issues and thus require a rethinking of design, manufacturing, testing, and validation of reliable next-generation systems. These manufacturability and dependability issues will be resolved efficiently only if a cross-layer approach that takes into account technology, circuit and architectural aspects will be developed.
This workshop will provide an open forum for presentations in the above-mentioned fields. The topics of interest include (but are not limited to):

  • Methodologies/techniques for manufacturing reliable nanoscale devices
  • System level design, on-line testing/fault tolerance
  • Verification and Validation/Debug Methodologies
  • Fault tolerance for space applications
  • Fault tolerance for transportation systems
  • Fault tolerance for medical devices

Agenda

TimeLabelSession
08:30Opening Session

Organisers:
Oliver Bringmann, FZI/University of Tuebingen, DE, Contact Oliver Bringmann
Mehdi Tahoori, Karlsruhe Institute of Technology, DE, Contact Medhi Tahoori

Chair:
Maria K Michael, University of Cyprus, CY, mmichael at ucy [dot] ac [dot] cy

Co-Chair:
Ozcan Ozturk, Bilkent University, TR, Contact Ozcan Ozturk


Welcoming comments:
08:45Keynote Talk
08:45W6.2.1Designing Efficient and Reliable Multicore Processors for Networking, Servers, and Beyond (Paper/SoftConf ID: 1226)
Speaker:
Shubu Mukherjee, Cavium Networks, US

09:45Paper Session I: New Challenges at the System Level
09:45W6.3.1Multi-Core Emulation for Dependable and Adaptive Systems Prototyping (Paper/SoftConf ID: 1227)
Speakers:
Cristiana Bolchini and Matteo Carminati, Politecnico di Milano, IT

09:45W6.3.2Fault-tolerant Routing Approach for 3D Stacked Meshes (Paper/SoftConf ID: 1228)
Speakers:
Masoumeh Ebrahimi, Masoud Daneshtalab and Juha Plosila, University of Turku, FI

10:30Coffee Break
11:00Paper Session II: Reliability Threads in New Technologies
11:00W6.4.1Invited Talk - Steep Slope Devices: Opportunities and Challenges for Processor Design (Paper/SoftConf ID: 1229)
Speaker:
Vijaykrishnan Narayanan, Penn State, US

11:00W6.4.2BTI reliability from Planar to FinFET nodes: Will the next node be more or less reliable? (Paper/SoftConf ID: 1231)
Speakers:
Halil Kukner1, Pieter Weckx2, Praveen Raghavan1, Ben Kaczer1, Doyoung Jang1, Francky Catthoor3, Liesbet Van der Perre2, Rudy Lauwereins3 and Guido Groeseneken3
1IMEC, BE; 2KU Leuven, BE; 3IMEC, KU Leuven, BE

11:00W6.4.3Analysis of Random Dopant Fluctuations and Oxide Thickness on a 16nm L1 Cache Design*) (Paper/SoftConf ID: 1230)
Speakers:
Cagri Eryilmaz1, Azam Seyedi2, Ozman Unsal3 and Andrian Cristal4
1Middle Eastern Technical University, TR and Barcelona Supercomputing Center, ES, ; 2Barcelona Supercomputing Center and Universitat Politecnica de Catalunya, ES; 3Barcelona Supercomputing Center, ES; 4Barcelona Supercomputing Center, Universitat Politecnica de Catalunya and IIIA-CSIC, ES

12:00Lunch Break
13:00Paper Session III: Application Specific Solutions
13:00W6.5.1FPGA Defect Tolerance based on Equivalent Configurations Generation (Paper/SoftConf ID: 1232)
Speakers:
Parthasarathy M. B. Rao, Abdulazim Amouri and Mehdi B. Tahoori, Karlsruhe Institute of Technology, DE

13:00W6.5.2A Complex Control System for Testing Fault-Tolerance Methodologies*) (Paper/SoftConf ID: 1243)
Speakers:
Jakub Podivinsky, Marcela Simkova and Zdenek Kotasek, Brno University of Technology, CZ

13:30Panel Session

Organiser:
Said Hamdioui, TU Delft, NL, S [dot] Hamdioui at tudelft [dot] nl

Chair:
Matteo Sonza Reorda, Politecnico di Torino, IT, Contact matteo sonza reorda

13:30W6.6.1Hardware v Software Engineering: Whose responsibility is the realization of future reliable computer systems? (Paper/SoftConf ID: 1267)
Speakers:
Mehdi Tahoori1, Oliver Bringmann2, Adrian Evans3 and Viacheslav Izosimov4
1Karlsruhe Institute of Technology, DE; 2FZI/University of Tuebingen, DE; 3iROC, FR; 4Semcon, SE

14:30Coffee Break & Poster Session
14:30W6.7.1BADR: Boosting Reliability Through Dynamic Redundancy (Paper/SoftConf ID: 1249)
Speakers:
Ihsen Alouani1, Smail Niar1, Mazen Saghir2 and Fadi Kurdahi3
1University of Valenciennes, FR; 2Texas A&M University, QA; 3University of California at Irving, US

14:30W6.7.2Automatic Detection and Correction of Defective Pixels for Medical and Space Imagers (Paper/SoftConf ID: 1250)
Speakers:
Eliahu Cohen1, Moriel Shnitser2, Tsvika Avraham2, Ofer Hadar2 and Yocheved Dotan3
1Tel-Aviv University, IL; 2Ben-Gurion University, IL; 3Ruppin Academic Center, IL

14:30W6.7.3Implementing Double Error Correction Orthogonal Latin Squares Codes in Xilinx FPGAs (Paper/SoftConf ID: 1251)
Speakers:
Mustafa Demirci1, Pedro Reviriego2 and Juan Antonio Maestro2
1Alesan, TR; 2Universidad Antonio de Nebrija, ES

14:30W6.7.4On Reliability Enhancement Using Adaptive Core Voltage Scaling and Variations on TSMC 28nm LP process process FPGAs (Paper/SoftConf ID: 1252)
Speakers:
Petr Pfeifer and Zdenek Pliva, Technical University of Liberec, CZ

14:30W6.7.5Power and Performance Optimization in Long-term Operation (Paper/SoftConf ID: 1253)
Speakers:
André Romão1, Jorge Semião1, Carlos Leong2, Marcelino Santos3, Isabel Teixeira3 and Paulo Teixeira3
1University of Algarve, PT; 2INESC-ID, PT; 3Technical University of Lisbon, PT

15:00Paper Session IV: Resiliency, Self-Test and Self-Diagnosis
15:00W6.8.1Invited Talk - DEEP-ER: Scalable resiliency in Exascale Computing (Paper/SoftConf ID: 1244)
Speaker:
Michael Kauschke, Intel, DE

15:00W6.8.2Improving the Reliability of Skewed Caches through ECC based Hashes (Paper/SoftConf ID: 1245)
Speakers:
Sercan Yegin1, Burak Karsli1, Oguz Ergin1, Marco Ottavi2, Salvatore Pontarelli2 and Pedro Reviriego3
1TOBB University, TR; 2University of Rome Tor Vergata, IT; 3Universidad Antonio de Nebrija, ES

15:00W6.8.3A new Diagnostic method for VLIW Processors*) (Paper/SoftConf ID: 1246)
Speakers:
Davide Sabena, Luca Sterpone and Matteo Sonza Reorda, Politecnico di Torino, IT

15:00W6.8.4Aging Monitoring Methodology for Built-In Self-Test Applications*) (Paper/SoftConf ID: 1247)
Speakers:
João Coelho1, Jorge Semião1, Carlos Leong2, Marcelino Santos3, Isabel Teixeira3 and Paulo Teixeira3
1University of Algarve, PT; 2INESC-ID, PT; 3Technical University of Lisbon, PT

16:15Closing Session

*)indicates short paper

Groups: