Tuesday 13 March, 2012 At-A-Glance

Interactive Presentations: 1600 - 1630 IP1 (in room Ground Floor)

Breaks:

Track	Room	0830 - 1030	1030 - 1230	1130 - 1300	1230 - 1430	1315 - 1415	1430 - 1600	1430 - 1630	1610 - 1630	1630 - 1650	1630 - 1830	1650 - 1710	1700 - 1830	1720 - 1830	1830 - 1930	1830 - 2000	1830 - 2045	1830 - 2100
1	Grosser Saal	1.1 OPENING AND KEYNOTE - Plenary: Opening and Keynote
1	Saal 5			2.1 EXECUTIVE SESSION - What Roles will the Foundries and Fabless Houses Play in Advanced Technology Nodes?			3.1 EXECUTIVE SESSION - How to handle today’s design complexity?						4.1 EXECUTIVE SESSION - Addressing Trends & Challenges of Automotive Chips
10	U Booth, Booth 50, Exhibition		UB01 UNIVERSITY BOOTH - Session 1		UB02 UNIVERSITY BOOTH - Session 2			UB03 UNIVERSITY BOOTH - Session 3			UB04 UNIVERSITY BOOTH - Session 4
2	Konferenz 6			2.2 Validation of Modern Microprocessors			3.2 Effective Functional Simulation and Validation						4.2 Routing solutions for upcoming NoC challenges
3	Konferenz 1			2.3 Memory System Optimisation			3.3 Industrial Design Methodologies						4.3 Industrial Embedded System Design
4	Konferenz 2			2.4 Architectures and Efficient Desgns for Automotive and Energy-Management Systems			3.4 Large-Scale Energy and Thermal Management						4.4 System-Level Power and Reliability Estimation and Optimisation
5	Konferenz 3			2.5 Physical Design for Low-Power			3.5 SPECIAL SESSION - PANEL - Key Challenges for the next generation of computing systems taming the data deluge						4.5 SPECIAL SESSION - EMBEDDED TUTORIAL - State-of-the-art Tools and Techniques for Quantitative Modeling and Analysis of Embedded Systems
6	Konferenz 4			2.6 Optimised Utilisation of Embedded Platforms			3.6 Model-Based Design and Verification for Embedded Systems						4.6 Compilers and Source-Level Simulation
7	Konferenz 5			2.7 SPECIAL SESSION - HOT TOPIC - EDA Solutions to New-Defect Detection in Advanced Process Technologies			3.7 Improving Reliability and Yield in Advanced Technologies						4.7 Advances in Test Generation
8	Exhibition Theatre			2.8 SPECIAL SESSION - EMBEDDED TUTORIAL - Beyond CMOS - Benchmarking for Future Technologies		ET1 PANEL - Analog Productivity – Design and Test of Analog/Mixed Signal ASICs	3.8 SPECIAL SESSION - HOT TOPIC - Design Automation Tools for Engineering Biological Systems		ET2 TESTIMONIAL - An Integrated Design Management Solution for Complex IC Design	ET3 TESTIMONIAL - OCARI – A Robust and Adaptive Wireless Sensor Network Protocol Providing a Solution for Industrial Long Term Operation Through its Implementation Using FPGA Technology		ET8 TESTIMONIAL - FLEXFEC: A flexible FEC ASIP Designed with Target’s IP Designer tool		ET4 PANEL - Modeling and Simulation Challenges in Automotive Electric System Design
0	Seminar 4														FM2 FRINGE MEETING - EDAA General Assembly
0	Konferenz 3															FM3 FRINGE MEETING - ETTTC Meeting
0	Konferenz 4																FM4 FRINGE MEETING - IEEE P1076.1 Working Group on VHDL-AMS
0	Konferenz 2																	FM5 FRINGE MEETING - SystemC User’s Group