9.7 Test and Monitoring of RF and Mixed-Signal ICs
Date: Thursday 15 March, 2012
Time: 0830 - 1000
Location / Room: Konferenz 5
Moderators:
S Sattler, Erlangen-Nuremberg U, DE
H Stratigopoulos, IMAG / CNRS, FR
The session will discuss approaches for measuring IQ imbalances in RF transceivers, for inferring implicitly the performance of RF blocks using non-intrusive built-in sensors and for monitoring on-line the degradation due to aging of analogue filters that are part of safety-critical automobile electronics.
| Time | ID | Presentation Title Authors |
|---|---|---|
| 0830 | 149 | AN ANALYTICAL TECHNIQUE FOR CHARACTERIZATION OF TRANSCEIVERS IQ IMBALANCES IN THE LOOP-BACK MODE A Nassery and S Ozev, Arizona State U, US |
| 0900 | 702 | TESTING RF CIRCUITS WITH TRUE NON-INTRUSIVE BUILT-IN SENSORS L Abdallah, H-G Stratigopoulos and S Mir, TIMA Laboratory, FR J Altet, UP Catalunya, ES |
| 0930 | 868 | MONITORING ACTIVE FILTERS UNDER AUTOMOTIVE AGING SCENARIOS WITH EMBEDDED INSTRUMENT J Wan and H G Kerkhoff, Twente U / CTIT, NL |
| IPs | IP4-12 | |
| 1000 | EXHIBITION BREAK/IP4 |
