12.8 SPECIAL SESSION - EMBEDDED TUTORIAL: Advances in variation-aware modeling, verification, and testing of analog ICs
Date: Thursday 15 March, 2012
Time: 1600 - 1728
Location / Room: Exhibition Theatre
Moderators:
M Miranda, IMEC, BE
Organisers:
T McConaghy, Solido Design Automation, CA
This session describes novel approaches for variation-aware modeling, verification, fault simulation, and testing of analog/custom ICs. The first speaker will present an approach for nonlinear, variation-aware behavioral modeling, via data mining and model-order reduction. The second speaker will present machine learning techniques to enable new industrial tools for fast, accurate PVT / statistical / high-sigma verification. The third speaker will describe an industrially-oriented approach to analog fault simulation that also applies to variation-aware design. The final speaker will present an analog test technique that addresses process variability and leverages adaptive test techniques.
