Tutorials

Organiser: Luca Fanucci, Pisa U, IT

Eleven pre-conference tutorials will be given on Monday. Three are full-day tutorials (A, B and C). Eight are half-day tutorials, four to be given in the morning (D1, E1, F1 and G1) and four in the afternoon (D2, E2, F2 and G2). A participant should enrol for either one full-day tutorial or one morning and/or one afternoon half-day tutorial (it is possible to attend for a morning or afternoon only in the case of the half-day tutorials). Combination of a full-day tutorial with a half-day tutorial is not allowed.

The titles, organisers, speakers, and abstracts of the tutorials are given below:

All tutorials run in parallel in accordance with the timetable below.

Rooms will be signposted.

0730-0930	Registration and Tutorial Welcome Refreshments
0930-1100	Tutorials
1100-1130	Break
1130-1300	Tutorials
1300-1430	Lunch
1330	CONFERENCE REGISTRATION BEGINS
1430-1600	Tutorials
1600-1630	Break
1630-1800	Tutorials
1800-1930	WELCOME RECEPTION
1900-2100	FRINGE TECHNICAL MEETINGS

Track	Room	0930 - 1800	0930 - 1300	1430 - 1800
1	Saal 5	A TUTORIAL - From MoC to SoC – Programming Embedded Multiprocessor Systems	D1 TUTORIAL - Multi-Core Platforms for Mixed-Critical Embedded Systems	D2 TUTORIAL - New challenges and technologies behind Cloud computing
2	Konferenz 6	B TUTORIAL - Manufacturing, Design, and Test of 2.5D- and 3D-Stacked ICs	E1 TUTORIAL - HW - SW design and verification for safety critical electronic systems: theory, normative and industry practices	E2 TUTORIAL - The Device-to-System Spectrum – A Tutorial on IC Design with Nanomaterials
3	Konferenz 1	C TUTORIAL - Mixed Signal IC Design and Test: Challenges, Solutions, and Industry Practice	F1 TUTORIAL - On Variability and Reliability; Dynamic Margining and Low Power	F2 TUTORIAL - Design methodology and techniques in production low-power SOC designs
4	Konferenz 2		G1 TUTORIAL - Demystifying Board-Level Test and Diagnosis	G2 TUTORIAL - Testing Embedded Memories in the Nano-Era: Fault Models, Tests, Industrial Results and BIST