DATE - Design, Automation and Test in Europe

Tuesday-At-A-Glance

Interactive Presentations (in Exhibition Area, Ground Floor): 1600 - 1630 IP1
Exhibition Break: 1030 - 1130

Breaks: 1300 - 1430 (Lunch) / 1600 - 1700

Track

Room

0830 - 1030

1130 - 1300

1430 - 1600

1700 - 1830

1

Saal 5, Ground Floor

Plenary

Opening Remarks and Awards

Keynote Addresses

 

Grosser Saal, Hall Level

2.1 EXECUTIVE SESSION – How to Address Today’s Growing System Complexity?

3.1 EXECUTIVE SESSION – The Impact of Nanometer Technologies on Manufacturability on Yield

4.1 EXECUTIVE SESSION – Impacts of Continuous Scaling on the Semiconductor Industry

2

Konferenz 6

2.2 EMBEDDED TUTORIAL – Embedded Systems and their Physical Environment – The ‘Cyberphysical’ View

3.2 Green and Emerging Technologies for Low Power

4.2 Variability Aware Low Power Design

3

Konferenz 1

2.3 Power-Aware Technique for Real-Time Systems

3.3 Game-Changing Technologies for System Design

4.3 Performance Estimation and Runtime Management of MPSoCs

4

Konferenz 2

2.4 System Level Design of Multicores

3.4 Application Development for Multicores

4.4 Application of Reconfigurable and Adaptive Systems

5

Konferenz 3

2.5 Reliability, Simulation, Yield and Enhancement

3.5 Advanced System Chip Testing

4.5 Wearout and Process Variation Mitigation and Modelling

6

Konferenz 4

2.6 Advances in Embedded Software Development

3.6 Real-Time Scheduling in Embedded Systems

4.6 Model Based Design of Embedded Systems

7

Konferenz 5

2.7 Memory Stacking and Cooling Solutions

3.7 Architectural Techniques for Robust Design

4.7 Extraction and Model Order Reduction

8 Exhibition Theatre, Ground Floor 2.8 PANEL SESSION – Are we there yet? Has System Assembly from IP Blocks Become Like Connecting LEGO Blocks? 3.8 HOT TOPIC - AUTOSAR and Automotive Software Design