DATE - Design, Automation and Test in Europe

4.7 Extraction and Model Order Reduction

Date: 
Tue, 2010-03-09
Time: 
17:00 - 18:30
Location / Room: 
Konferenz 5

Moderators:
T Dhaene, Ghent U, BE
L M Silveira, INESC ID / IST – TU Lisbon, PT

The papers in this session deal with various problems in interconnect extraction and compression of the resulting models. The first two papers address important issues in extraction, presenting novel and efficient methods to account for the effect of variations and the presence of the substrate in 3D interconnects. The last two papers discuss improvements in sampling based order reduction and passivity enforcement in boundary element simulations of interconnect systems.

1700 VARIATION-AWARE INTERCONNECT EXTRACTION USING STATISTICAL MOMENT PRESERVING MODEL ORDER REDUCTION
T A El-Moselhy and L Daniel, MIT, US
1730 EFFICIENT 3D HIGH-FREQUENCY IMPEDANCE EXTRACTION FOR GENERAL INTERCONNECTS AND INDUCTORS ABOVE A LAYERED SUBSTRATE
N Srivastava, Mentor Graphics Corporation, US
R Suaya, Mentor Graphics Corporation, FR
K Banerjee, UC Santa Barbara, US
1800 HORUS - HIGH-DIMENSIONAL MODEL ORDER REDUCTION VIA LOW MOMENT-MATCHING UPGRADED SAMPLING
J Fernandez Villena, INESC ID / IST - TU Lisbon, PT
L M Silveira, INESC ID / IST - TU Lisbon / Cadence Research Labs, PT
1815 ON PASSIVITY OF THE SUPER NODE ALGORITHM FOR EM MODELING OF INTERCONNECT SYSTEMS
M Ugryumova, TU Eindhoven, NL
W H A Schilders, TU Eindhoven and NXP Semiconductors, NL
IPs IP2-7
1830 CLOSE