DATE - Design, Automation and Test in Europe

3.7 Architectural Techniques for Robust Design

Date: 
Tue, 2010-03-09
Time: 
14:30 - 16:00
Location / Room: 
Konferenz 5

Moderators: 
T Austin, U of Michigan, US
C Silvano, Politecnico di Milano, IT

This session presents architectural techniques for robust and efficient design.  The first paper proposes a technique for characterising the vulnerability of microprocessor structures to intermittent faults in advanced CMOS processes.  The second paper uses novel detection and correction circuits to achieve aging-resilience in pipelined architectures.  The third paper proposes an integrated framework for joint design space exploration and co-optimisation of microarchitecture and circuits for digital systems.

1430 IVF: CHARACTERIZING THE VULNERABILITY OF MICROPROCESSOR STRUCTURES TO INTERMITTENT FAULTS
S Pan, Y Hu and X Li, Chinese Academy of Sciences, PRC
1500 AGING-RESILIENT DESIGN OF PIPELINED ARCHITECTURES USING NOVEL DETECTION AND CORRECTION CIRCUITS
H Dadgour and K Banerjee, UC Santa Barbara, US
1530 AN INTEGRATED FRAMEWORK FOR JOINT DESIGN SPACE EXPLOREATION OF MICROARCHITECTURE AND CIRCUITS
O Azizi, J P Stevenson, S J Patel and M Horowitz, Stanford U, US
A Mahesri, Illinois U, Urbana-Champaign, US
IPs IP1-18
1600  BREAK/IP1