Moderators:
T Austin, U of Michigan, US
C Silvano, Politecnico di Milano, IT
This session presents architectural techniques for robust and efficient design. The first paper proposes a technique for characterising the vulnerability of microprocessor structures to intermittent faults in advanced CMOS processes. The second paper uses novel detection and correction circuits to achieve aging-resilience in pipelined architectures. The third paper proposes an integrated framework for joint design space exploration and co-optimisation of microarchitecture and circuits for digital systems.
| 1430 | IVF: CHARACTERIZING THE VULNERABILITY OF MICROPROCESSOR STRUCTURES TO INTERMITTENT FAULTS S Pan, Y Hu and X Li, Chinese Academy of Sciences, PRC |
| 1500 | AGING-RESILIENT DESIGN OF PIPELINED ARCHITECTURES USING NOVEL DETECTION AND CORRECTION CIRCUITS H Dadgour and K Banerjee, UC Santa Barbara, US |
| 1530 | AN INTEGRATED FRAMEWORK FOR JOINT DESIGN SPACE EXPLOREATION OF MICROARCHITECTURE AND CIRCUITS O Azizi, J P Stevenson, S J Patel and M Horowitz, Stanford U, US A Mahesri, Illinois U, Urbana-Champaign, US |
| IPs | IP1-18 |
| 1600 | BREAK/IP1 |